Tektronix TDS7104 Digital Oscilloscope, 4 CH, 1 GHz
| Place of Origin: | USA |
|---|
Company Profile
| Location: | United States |
|---|---|
| Business Type: | Trading Company, Distributor/Wholesaler |
Product Description
Tektronix TDS7104
Digital Phosphor Oscilloscope; 1GHz, 4 Channel
Tektronix TDS7104 Digital Oscilloscope, 4 CH, 1 GHz
TDS7000 Series Digital Phosphor Oscilloscopes are high performancesolutions for verification, debug and characterization of sophisticatedelectronic designs. The family features exceptional signal acquisitionperformance, operational simplicity and open connectivity to the designenvironment. Classic analog-style controls, a large touch-sensitivedisplay and graphical menus provide intuitive control. Open access tothe Microsoft Windows operating system enables unprecedentedcustomization and extensibility.
TDS7000 models range from 500 MHz to 4 GHz bandwidth with single-shotsample rates to 20 GS/s, meeting demands of the latest high speed logicfamilies and multi-Gigabit communication standards. Acquisition memoryoptions from 2 to 32 Megasamples maximize the value of high sample rateand ensure that critical events are captured with fine detail.
High performance jitter analysis to 1.5 ps RMS is achieved throughexceptional trigger and acquisition performance, deep memory and appliedsoftware.
TDS7000 Series high bandwidth signal access solutions include the P7240 4GHz (120 ps rise time) active probe and the P7330 3.5 GHz (<130 psrise time, typical, <140 ps guaranteed) differential probe. Smallform-factors and a wide array of tip accessories ensure effectiveness.In addition, the TDS7404, TDS7254 and TDS7154 include the TekConnectsignal interconnect system. This interface replaces traditional BNCinput connectors with a convenient positive-locking interface suitablefor higher system bandwidths. P7000 Series probes are directlycompatible with TekConnect signal interconnect system along withadapters that provide SMA, BNC and N connections.
Features:
TDS7000 Series Digital Phosphor Oscilloscopes are high performancesolutions for verification, debug and characterization of sophisticatedelectronic designs. The family features exceptional signal acquisitionperformance, operational simplicity and open connectivity to the designenvironment. Classic analog-style controls, a large touch-sensitivedisplay and graphical menus provide intuitive control. Open access tothe Microsoft Windows operating system enables unprecedentedcustomization and extensibility.
TDS7000 models range from 500 MHz to 4 GHz bandwidth with single-shotsample rates to 20 GS/s, meeting demands of the latest high speed logicfamilies and multi-Gigabit communication standards. Acquisition memoryoptions from 2 to 32 Megasamples maximize the value of high sample rateand ensure that critical events are captured with fine detail.
High performance jitter analysis to 1.5 ps RMS is achieved throughexceptional trigger and acquisition performance, deep memory and appliedsoftware.
TDS7000 Series high bandwidth signal access solutions include the P7240 4GHz (120 ps rise time) active probe and the P7330 3.5 GHz (<130 psrise time, typical, <140 ps guaranteed) differential probe. Smallform-factors and a wide array of tip accessories ensure effectiveness.In addition, the TDS7404, TDS7254 and TDS7154 include the TekConnectsignal interconnect system. This interface replaces traditional BNCinput connectors with a convenient positive-locking interface suitablefor higher system bandwidths. P7000 Series probes are directlycompatible with TekConnect signal interconnect system along withadapters that provide SMA, BNC and N connections.
Features:
- 1GHz Bandwidth
- Up to 20 GS/ s Real- time Sample Rate
- Up to 32 Megasamples Memory Depth
- >400,000 Wfms/ second Maximum Waveform Capture Rate
- Optional Communications Mask Testing Up to 2 .5 Gb/ s Rates
- Optional Clock Recovery from Serial Data Streams
- Optional 32-bit Serial Trigger for Isolation of Pattern dependent Effects
- 10 MHz Timebase Reference Input for Enhanced Accuracy and Repeatability
- Graphical User Interface
- Control via Classic Direct Controls, Touch-sensitive Color Display or Mouse Navigation
- Open Microsoft Windows Environment
- Built- in Networking
1M = 2 Msamples max, 500 ksamples/ch
2M = 8 Msamples max, 2 Msamples/ch
3M = 16 Msamples max, 4 Msamples/ch
1K = K4000 Scope Cart
1R = Rackmount Kit
J1 = TDSJIT2 Jitter Analysis Software
J2 = TDSDDM2 Disk Drive Analysis Software
CP2 = TDSCPM2-ANSI/ITU Telecom Pulse Compliance Testing
USB = TDSUSBS-USB2.0 Compliance Test S/W Only
33 = Add (1) P6158 3 GHz, 20x Low C Probe
36 = Add (1) P6139A 500 MHz, 10x Passive Probe
37 = Add (1) P6245 1.5 GHz Active Probe
39 = Add (1) P6248 1.7 GHz Differential Probe
SM = Serial Comm Mask Testing