Digital Ultrasonic Flaw Detector TOFD-400 Negative square wave pulseadjustable
| Place of Origin: | Zhejiang |
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Company Profile
| Location: | Shenzhen, Guangdong, China (Mainland) |
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| Business Type: | Manufacturer |
| Main Products: | IEC Test Equipment, Flammability Testing Equipment, Ingress Protection Test Equipment |
Product Detail
| Model No.: | TOFD400 |
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Product Description
TOFD-400 Ultrasonic Flaw Detector,TOFD technique is to use the work of a new ultrasonic non-destructive testing equipment. It is the high rate of detection of defects in quantitative high positioning accuracy, detection is simple and quick detection efficiency.
With intelligence operations, "one button TOFD" scanning to enable beginners to quickly master, unique touch-screen controls, buttons and the mouse can be used simultaneously, Shuttle controls can be a shuttle in the end, the operation is extremely simple, is the most compact "TOFD" flaw detector, including the battery weighs only 2.25 kg.
Parameter
|
Pulse type |
Negative square wave pulse(adjustable) |
|
Pulse edge |
<10ns |
|
Pulse width |
30~1000ns continuously adjustable |
|
Repetition frequency |
1001000Hz adjustable |
|
Detection mode |
hardware detection |
|
sampling frequency |
100MHz |
|
Frequency band width |
0.5~5MHz,2~10MHz,4~15MHz,0.5~20MHz(broadband) |
|
Waveform display |
radio-wave, full wave, positive half-wave, negative half-wave |
|
Sound Velocity Range |
30020000m/s |
|
Sound range |
5200μs |
|
Delay range |
0200μs |
|
Trigger Mode |
encoder trigger(maximum resolution 0.25mm),time-triggered(Maximum Resolution force 5ms) |
|
Equivalent Input Noise |
40×10-9 V/ √Hz |
|
Attenuation Accuracy |
< ±1dB/20dB |
|
After the transmit pulse blind |
< 2ns |
|
Imaging mode |
according to the instrument settings and scanning mode display B sweep, D sweep, P sweep, TOFD imaging |
|
Record method |
Complete raw data recording method records (per period "= 5 points) |
|
Scan length |
longest single-200m, each piece of 2m can be saved 200pcs |
|
Off-line data analysis |
recovery and playback scan A-scan waveforms recorded Defect size and contour |