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UV-762PC Dual-beam uv. Spectrophotometer

1.0~100.0 USD
Min. Order: 1 Set/Sets
Trade Term: FOB
Payment Terms: L/C, T/T
Supply Ability: 1000set
Place of Origin: Guangdong

Company Profile

Location: Zhuhai, Guangdong, China (Mainland)
Business Type: Manufacturer
Main Products: 4. DUK-2A Multi-Electrode Resistivity Survey System

Product Detail

Means of Transport: Ocean
Brand Name: dshing
Production Capacity: 1000set
Packing: wooden case
Delivery Date: 7 days
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Product Description

Key components are of high quality, new unique optical system design, cause the instrument with excellent optical properties and metering performance, low stray light, high metering accuracy and reliability.
(1)Features:
1.The real double beam metering system, with advanced circuit measurement and control system, make the instrument with high reliability and low noise.
2.Unique installation of deuterium lamps and tungsten lamps, the design and working way of  automatic light switch and finding the best location , allowing users to operate the instruments and maintain or replace light source in a more convenient ,correct and safer way.
3.Adopt large screen Chinese window (LED) LCD screen, has a good human-machine conversation interface.
4.Excellent software design and procedure, make instruments have stronger spectral data processing function: automatically scan measured spectra, multi-wavelength (1-3λ ) determination, kinetic determination, 1-3 curve fitting, 1-4 derivative spectra, access ,display, print spectra and analyze data.
5.Powerful Windows-based software platform, user-friendly, powerful, easy to store or output, and to facilitate business, save costs.
(2)Performance index:
1.Wavelength range:190nm1100nm
2.Spectral bandwidth:2nm
3.Wavelength accuracy:≤ ± 0.3nm ( automatically correct when boot)
4.Wavelength repeatability:≤0.2nm
5.Transmission ratio accuracy:±0.3 %(T)
6.Transmission ratio repeatability:0.2 %( T)
7.Transmission ratio measurement range:0200%T
8.Absorbency measurement range:-0.3013.000A
9.Stray light :≤0.15% (at 220nm point, with NAI determined)
10.Drift:≤0.004A/H (500nmpoint)
11.Noise:100% of line noise ≤ 0.15% T; 0% line noise ≤ 0.1% T
12.Scanning speed:Fast medium low
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